INTEGRATED PHOTONICS Device-level photonic testing

Year: 2015

Authors: Burresi M.

Autors Affiliation: Istituto Nazionale di Ottica (CNR-INO), Largo Fermi 6, 50125 Firenze (FI),Italy and the European Laboratory for
Non-linear Spectroscopy (LENS), 50019 Sesto Fiorentino (FI), Italy

Abstract: Non-invasive, multispectral characterization of integrated photonic circuits paves the way towards optical methodologies ready for industrial applications.


Volume: 9 (1)      Pages from: 8  to: 9

KeyWords: photonic circuits
DOI: 10.1038/nphoton.2014.313

Citations: 1
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