Deep level traps in Se-doped MOCVD AlxGa1-xAs
Year: 1987
Authors: HANNA M.C., OH E.G., SZMYD D.M., LUCCHESINI A., MAJERFELD A.
Autors Affiliation: University of Colorado at Boulder, Boulder, CO USA
Journal/Review:
KeyWords: impurity and defect levels; III-V semiconductors;