Controlled variation of the refractive index in ion-damaged diamond
Year: 2010
Authors: Olivero P., Calusi S., Giuntini L., Lagomarsino S., Lo Giudice A., Massi M., Sciortino S., Vannoni M., Vittone E.
Autors Affiliation: Experimental Physics Department and “Nanostructured Interfaces and Surfaces” Centre of Excellence, University of Torino, via P. Giuria 1, 10125 Torino, Italy; INFN Sezione di Torino, Italy; Physics Department of University Firenze, via Sansone 1, 50019 Sesto Fiorentino (Firenze), Italy; INFN, Firenze, via Sansone 1, 50019 Sesto Fiorentino (Firenze), Italy; Energetics Department of University via Sansone 1, 50019 Sesto Fiorentino (Firenze), Italy; CNR – Istituto Nazionale di Ottica Applicata, Largo E. Fermi 6, 50125 Firenze, Italy
Abstract: A fine control of the variation of the refractive index as a function of structural damage is essential in the fabrication of diamond-based optical and photonic devices. We report here about the variation of the real part of the refractive index at lambda = 632.8 nm in high-quality single-crystal diamond damaged with 2 and 3 MeV protons at low-medium fluences (10(13)-10(17) ions cm(-2)). After implanting the samples in 125 x 125 mu m(2) areas with a raster scanning ion microbeam, the variation of optical thickness of the implanted regions was measured with laser interferometric microscopy. The results were analyzed with a model based on the specific damage profile. The technique allows the direct fabrication of optical structures in bulk diamond based on the localized variation of the refractive index, which will be explored in future works. (C) 2010 Elsevier B.V. All rights reserved.
Journal/Review: DIAMOND AND RELATED MATERIALS
Volume: 19 (5-6) Pages from: 428 to: 431
KeyWords: diamond; refractive index; interferometryDOI: 10.1016/j.diamond.2009.12.011ImpactFactor: 1.825Citations: 26data from “WEB OF SCIENCE” (of Thomson Reuters) are update at: 2024-12-01References taken from IsiWeb of Knowledge: (subscribers only)Connecting to view paper tab on IsiWeb: Click hereConnecting to view citations from IsiWeb: Click here