Phase-shifting point-diffraction interferometer developed by using the electro-optic effect in ferroelectric crystals
Year: 2006
Authors: Paturzo M., Pignatiello F., Grilli S., De Nicola S., Ferraro P.
Autors Affiliation: CNR – Istituto Nazionale di Ottica Applicata and LENS European Laboratory for Non-Linear Spectroscopy, Via Campi Flegrei 34, 80078 Pozzuoli (NA), Italy
Abstract: A novel and simple phase-shifting point-diffraction interferometer using a z-cut lithium niobate wafer is proposed. The pinhole is realized by an optical lithography process, aluminum deposition, and subsequent liftoff on the surface of the wafer. The phase shifting is obtained by inducing the electro-optic effect along the z crystal axis. We demonstrate experimentally the possibility of retrieving an aberrated wavefront. (c) 2006 Optical Society of America.
Journal/Review: OPTICS LETTERS
Volume: 31 (24) Pages from: 3597 to: 3599
KeyWords: AccuracyDOI: 10.1364/OL.31.003597ImpactFactor: 3.598Citations: 17data from “WEB OF SCIENCE” (of Thomson Reuters) are update at: 2024-12-01References taken from IsiWeb of Knowledge: (subscribers only)Connecting to view paper tab on IsiWeb: Click hereConnecting to view citations from IsiWeb: Click here