On the origin of internal field in Lithium Niobate crystals directly observed by digital holography
Year: 2005
Authors: Paturzo M., Ferraro P., Grilli S., Alfieri D., De Natale P., de Angelis M., Finizio A., De Nicola S., Pierattini G., Caccavale F., Callejo D., Morbiato A.
Autors Affiliation: Istituto Nazionale di Ottica Applicata, Sez. di Napoli, Via Campi Flegrei 34, 80078 Pozzuoli (NA), Italy;
Istituto di Cibernetica “E. Caianiello” del CNR, Via Campi Flegrei 34, 80078 Pozzuoli (NA), Italy;
SAES Getters S.p.A., Viale Italia 77, 20020 Lainate, Milano, Italy
Abstract: We show the defect dependence of the internal field in Lithium Niobate using a full-field interferometric method and demonstrate that it can be directly measured on some clusters of defects embedded in a stoichiometric matrix. Results show that the value of the internal field grows in proximity of defects and vanishes far from them, which addresses the long-standing issue about its origin in Lithium Niobate crystal. (C) 2005 Optical Society of America.
Journal/Review: OPTICS EXPRESS
Volume: 13 (14) Pages from: 5416 to: 5423
KeyWords: Defects; Electrooptical materials; Holographic interferometry; Image reconstruction; Lithium niobate; Stoichiometry, Defect dependence; Internal field growth; Stoichiometric matrix, Crystalline materialsDOI: 10.1364/OPEX.13.005416ImpactFactor: 3.764Citations: 32data from “WEB OF SCIENCE” (of Thomson Reuters) are update at: 2024-12-01References taken from IsiWeb of Knowledge: (subscribers only)Connecting to view paper tab on IsiWeb: Click hereConnecting to view citations from IsiWeb: Click here