Close to the diffraction limit in high resolution ATR FTIR mapping: demonstration on micrometric multi-layered art systems

Anno: 2017

Autori: Bertasa M., Possenti E., Botteon A., Conti C., Sansonetti A., Fontana R., Striova J., Sali D.

Affiliazione autori: CNR, ICVBC, Via Cozzi 53, I-20125 Milan, Italy; Univ Turin, Dipartimento Chim, Via Pietro Giuria 7, I-10125 Turin, Italy; Univ Milan, Dipartimento Sci Terra, Via Botticelli 23, I-20133 Milan, Italy; CNR INO, Largo E Fermi 6, Florence, Italy; Bruker Italia Srl, Unipersonale, Vle V Lancetti 43, I-20158 Milan, Italy.

Abstract: This paper is aimed at demonstrating the potentiality of high resolution Attenuated Total Reflection Fourier Transform Infrared micro-mapping (micro-ATR-FTIR) to reconstruct the images of micrometric multi-layered systems. This method can be an effective analytical alternative when the layer thickness requires high lateral resolution, and fluorescence or thermal effects prevent the deployment of conventional analytical techniques such as micro-Raman spectroscopy. This study demonstrates the high micro-ATR-FTIR setup performances in terms of lateral resolution, spectral quality and chemical image contrast using a new laboratory instrument equipped with a single element detector. The method has been first validated on mock-ups and then successfully applied on cross-sectional samples from real artworks: Leonardo da Vinci

Giornale/Rivista: ANALYST

Volume: 142 (24)      Da Pagina: 4801  A: 4811

Maggiori informazioni: The authors would like to acknowledge the “Direzione delle Raccolte Artistiche del Castello Sforzesco”, Milan City Council and Italian Ministry of Cultural Heritage.
Parole chiavi: Fourier transform infrared (FTIR) micros; Attenuated Total Reflection (ATR) mappin; chemical imaging; micrometric multi-layers; cultural heritage
DOI: 10.1039/c7an00873b

Citazioni: 12
dati da “WEB OF SCIENCE” (of Thomson Reuters) aggiornati al: 2025-01-12
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