Optical characterization of PMMA phase gratings written by a 387 nm femtosecond laser

Anno: 2011

Autori: Baum A., De Nicola S., Abdalah S., Al-Naimee K., Geltrude A., Locatelli M., Meucci R., Perrie W., Scully P.J., Taranu A., Arecchi F.T.

Affiliazione autori: The Photon Science Institute, University of Manchester, Manchester, M30 9PL, UK;
CNR – Istituto Nazionale di Ottica, L. E. Fermi 6, 50125 Firenze, Italy;
Dipartimento di Fisica, Università di Firenze, 50019 Sesto Fiorentino, Italy

Abstract: We report on the fabrication of optical Bragg type phase gratings in polymethyl methacrylate substrates by a femptosecond Ti: Sapphire laser. As for their optical characterization, a spatially resolved microscopy interferometric technique is used to investigate the two-dimensional distribution of the refractive index change produced by the irradiation process. The technique gives a direct and quantitative two-dimensional profile of the index of refraction in irradiated PMMA, providing information on how the fabrication process depends on the laser irradiation. (C) 2011 Elsevier B.V. All rights reserved.

Giornale/Rivista: OPTICS COMMUNICATIONS

Volume: 284 (12)      Da Pagina: 2771  A: 2774

Maggiori informazioni: Florence\’s group acknowledges Ente Cassa di Risparmio di Firenze (ECRF) for financial support.
Parole chiavi: Fabrication process; Femto-second laser; Index of refraction; Interferometric techniques; Irradiation process; Laser irradiations; Optical characterization; Phase grating; Refractive index changes; Spatially resolved; Ti: Sapphire laser; Two dimensional distribution, Irradiation; Refractive index; Two dimensional, Computerized tomography
DOI: 10.1016/j.optcom.2011.02.032

Citazioni: 5
dati da “WEB OF SCIENCE” (of Thomson Reuters) aggiornati al: 2025-05-18
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