High spatial resolution second-harmonic interferometry

Anno: 2013

Autori: Conti F., Tiberi M., Giammanco F., Diaspro A., Brandi F.

Affiliazione autori: Dipartimento di Fisica e Fermi, Università Degli Studi di Pisa, Largo B Pontecorvo 3, I-56127 Pisa, Italy;
Plasma Diagnostics and Technologies Ltd, via Roma 30, I-56127 Pisa, Italy;
Dipartimento di Nanofisica, Istituto Italiano di Tecnologia, Via Morego 30, I-16163 Genova, Italy

Abstract: A monolithic compact fully fiber coupled Nd:YAG (yttrium aluminum garnet) continuous wave laser based second-harmonic interferometer with 60 µm spatial resolution is presented. The device is tested by measuring the dispersion of laser etched polymeric films; the result found is a phase shift sensitivity down to 7 × 10-3 rad for an acquisition time as fast as 300 µs. These results demonstrate the feasibility of high spatial resolution second-harmonic interferometry, and an outlook is given for its use as a novel quantitative phase sensitive imaging technique.

Giornale/Rivista: LASER PHYSICS LETTERS

Volume: 10 (5)      Da Pagina: 056003-1  A: 056003-4

Parole chiavi: DISPERSION MICROSCOPY; LASER; GENERATION
DOI: 10.1088/1612-2011/10/5/056003

Citazioni: 4
dati da “WEB OF SCIENCE” (of Thomson Reuters) aggiornati al: 2025-05-18
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