On the origin of internal field in Lithium Niobate crystals directly observed by digital holography

Anno: 2005

Autori: Paturzo M., Ferraro P., Grilli S., Alfieri D., De Natale P., de Angelis M., Finizio A., De Nicola S., Pierattini G., Caccavale F., Callejo D., Morbiato A.

Affiliazione autori: Istituto Nazionale di Ottica Applicata, Sez. di Napoli, Via Campi Flegrei 34, 80078 Pozzuoli (NA), Italy;
Istituto di Cibernetica “E. Caianiello” del CNR, Via Campi Flegrei 34, 80078 Pozzuoli (NA), Italy;
SAES Getters S.p.A., Viale Italia 77, 20020 Lainate, Milano, Italy

Abstract: We show the defect dependence of the internal field in Lithium Niobate using a full-field interferometric method and demonstrate that it can be directly measured on some clusters of defects embedded in a stoichiometric matrix. Results show that the value of the internal field grows in proximity of defects and vanishes far from them, which addresses the long-standing issue about its origin in Lithium Niobate crystal. (C) 2005 Optical Society of America.

Giornale/Rivista: OPTICS EXPRESS

Volume: 13 (14)      Da Pagina: 5416  A: 5423

Parole chiavi: Defects; Electrooptical materials; Holographic interferometry; Image reconstruction; Lithium niobate; Stoichiometry, Defect dependence; Internal field growth; Stoichiometric matrix, Crystalline materials
DOI: 10.1364/OPEX.13.005416

Citazioni: 32
dati da “WEB OF SCIENCE” (of Thomson Reuters) aggiornati al: 2025-05-18
Riferimenti tratti da Isi Web of Knowledge: (solo abbonati)
Link per visualizzare la scheda su IsiWeb: Clicca qui
Link per visualizzare la citazioni su IsiWeb: Clicca qui