Scientific Results

Medium-term stability effects on a fused silica planarity standard

Year: 2006

Authors: Vannoni M., Molesini G.

Autors Affiliation: CNR – Istituto Nazionale di Ottica Applicata, Largo E. Fermi 6, 50125 Firenze, Italy

Conference title: Conference on Precision Electromagnetic Measurements (CPEM)
Place: Torino

KeyWords: planarity; Interferometry;