Optical characterization of semiconductor microcavities by spatially resolved imaging and resonant Rayleigh scattering
Anno: 2002
Autori: Gurioli M., Bogani F., Wiersma D., Roussignol P., Cassabois G., Khitrova G., Gibbs H.
Affiliazione autori: Istituto Nazionale di Fisica della Materia, Dipartimento di Scienza dei Materiali, Universit- Milano Bicocca, Via Cozzi 53, 20125 Milano, Italy; Istituto Nazionale di Fisica della Materia, Dipartimento di Energetica, Universit- di Firenze, Via Santa Marta 3, 50134 Firenze, Italy; Istituto Nazionale di Fisica della Materia, Laboratorio Europeo di Spettroscopia non Lineare, Universit- di Firenze, Largo E. Fermi 2, 50125 Firenze, Italy; Laboratoire de Physique de la Mati-re Condens-e de l
Abstract: It is shown that images of the coherent emission from microcavity (MC) surfaces can be used for the characterization of both intrinsic and extrinsic optical properties. The method allows one to overcome the well-known problem of inhomogeneous broadening due to the MC wedge. In addition, the presence of static disorder associated with dielectric fluctuations in a Bragg reflector is observed. This is also confirmed by resonant Rayleigh scattering measurements and it is attributed to misfit dislocations induced by the large thickness of the mismatched AlGaAs alloy in the Bragg mirrors.
Giornale/Rivista: PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE
Volume: 190 (2) Da Pagina: 363 A: 367
Parole chiavi: Imaging techniques; Mirrors; Optical properties; Rayleigh scattering; Semiconducting aluminum compounds; Semiconductor quantum wells, Bragg reflectors; Dielectric fluctuations; Semiconductor microcavities; Spatially resolved imaging, Cavity resonatorsDOI: Clicca quiLink per visualizzare la citazioni su IsiWeb: Clicca qui