Focused Gaussian beam in the paraxial approximation
Anno: 2020
Autori: Das A., Soltani N., Agio M.
Affiliazione autori: Laboratory of Nano-Optics and Cμ, University of Siegen, 57072 Siegen, Germany;
National Institute of Optics (INO), National Research Council (CNR), 50125 Florence, Italy
Abstract: A focused Gaussian beam represents a case of highly practical importance in many areas of optics and photonics. We derive analytical expressions for a focused Gaussian beam in the paraxial approximation, considering an arbitrary lens filling factor. We discuss the role of higher-order Bessel functions of the first kind in defining the electric field in the focal region.
Giornale/Rivista: OPTICS LETTERS
Volume: 45 (24) Da Pagina: 6752 A: 6754
Maggiori informazioni: Universitat Siegen; Deutsche Forschungsgemeins chaft (INST 221/118-1 FUGG); Bundesministerium fur Bildung und Forschung (13N14746).Parole chiavi: focused beams; paraxial approximationDOI: 10.1364/OL.414302Link per visualizzare la scheda su IsiWeb: Clicca qui