Nonlinear characterization of nanometer-thick dielectric layers by surface plasmon resonance techniques
Anno: 2003
Autori: Margheri G., Giorgetti E., Sottini S., Toci G.
Affiliazione autori: Ist. di Fis. Appl. Nello Carrara, Consiglio Nazionale delle Ricerche, Via Panciatichi 64, 50127 Florence, Italy
Abstract: The nonlinear characterization of nanometer-thick dielectric layers was performed. The surface plasmon resonance techniques were used for the purpose. The off-resonant intensity-dependent refractive index of 10-200-nm-thick films of the soluble polycarbazolyldiacetylene 1,6-bis-(3,6-dihexadecyl-N-carbazolyl)-2,4-hexadiyne deposited upon silver was measured at 1064 nm.
Giornale/Rivista: JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B: OPTICAL PHYSICS
Volume: 20 (4) Da Pagina: 741 A: 751
Parole chiavi: Dielectric materials; Nanostructured materials; Surface plasmon resonance, Optical mixing, Nonlinear opticsDOI: 10.1364/JOSAB.20.000741Citazioni: 17dati da “WEB OF SCIENCE” (of Thomson Reuters) aggiornati al: 2024-05-05Riferimenti tratti da Isi Web of Knowledge: (solo abbonati) Link per visualizzare la scheda su IsiWeb: Clicca quiLink per visualizzare la citazioni su IsiWeb: Clicca qui