Nonlinear characterization of nanometer-thick dielectric layers by surface plasmon resonance techniques

Anno: 2003

Autori: Margheri G., Giorgetti E., Sottini S., Toci G.

Affiliazione autori: Ist. di Fis. Appl. Nello Carrara, Consiglio Nazionale delle Ricerche, Via Panciatichi 64, 50127 Florence, Italy

Abstract: The nonlinear characterization of nanometer-thick dielectric layers was performed. The surface plasmon resonance techniques were used for the purpose. The off-resonant intensity-dependent refractive index of 10-200-nm-thick films of the soluble polycarbazolyldiacetylene 1,6-bis-(3,6-dihexadecyl-N-carbazolyl)-2,4-hexadiyne deposited upon silver was measured at 1064 nm.

Giornale/Rivista: JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B: OPTICAL PHYSICS

Volume: 20 (4)      Da Pagina: 741  A: 751

Parole chiavi: Dielectric materials; Nanostructured materials; Surface plasmon resonance, Optical mixing, Nonlinear optics
DOI: 10.1364/JOSAB.20.000741

Citazioni: 17
dati da “WEB OF SCIENCE” (of Thomson Reuters) aggiornati al: 2024-05-05
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